TLV3801DSGT

Texas Instruments
595-TLV3801DSGT
TLV3801DSGT

Mfr.:

Description:
Analog Comparators 225-ps high-speed co mparator with LVDS TLV3801DSGR

Datasheet:
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In Stock: 398

Stock:
398 Can Dispatch Immediately
Factory Lead Time:
18 Weeks Estimated factory production time for quantities greater than shown.
Minimum: 1   Multiples: 1
Unit Price:
$-.--
Ext. Price:
$-.--
Est. Tariff:
Packaging:
Full Reel (Order in multiples of 250)

Pricing (SGD)

Qty. Unit Price
Ext. Price
Cut Tape / MouseReel™ †
$8.51 $8.51
$6.54 $65.40
$6.03 $150.75
$5.49 $549.00
Full Reel (Order in multiples of 250)
$5.22 $1,305.00
$4.98 $2,490.00
$4.83 $4,830.00
$4.79 $11,975.00
† A MouseReel™ fee of $10.00 will be added and calculated in your basket. All MouseReel™ orders are non-cancellable and non-returnable. ↩

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Analog Comparators
RoHS:  
SMD/SMT
WSON-8
1 Channel
LVDS
Differential
2.7 V
5.25 V
500 uV
10 uA
- 40 C
+ 125 C
TLV3801
Reel
Cut Tape
MouseReel
Brand: Texas Instruments
CMRR - Common Mode Rejection Ratio: 80 dB
Country of Assembly: TH
Country of Diffusion: DE
Country of Origin: TH
Ios - Input Offset Current: 100 nA
Moisture Sensitive: Yes
Product: Analog Comparators
Product Type: Analog Comparators
Propagation Delay Time: 225 ps
PSRR - Power Supply Rejection Ratio: 80 dB
Shutdown: No Shutdown
Factory Pack Quantity: 250
Subcategory: Amplifier ICs
Vcm - Common Mode Voltage: 5.25 V
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Attributes selected: 0

Datasheet

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CNHTS:
8542399000
CAHTS:
8542330000
USHTS:
8542330001
MXHTS:
8542330299
ECCN:
EAR99

TLV380x/TLV380x-Q1/TLV3811 High-Speed Comparators

Texas Instruments TLV380x/TLV380x-Q1/TLV3811 High-Speed Comparators have a wide power supply range and a very high toggle frequency of 3GHz. With an operating supply voltage range of 2.7V to 4.2V for single supply and 2.7V to 5.25V for split supply, these features come in industry-standard small packages. These features make these devices an excellent choice for LIDAR, differential line receiver applications, and test and measurement systems.

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